統計数学セミナー
Seminar on Probability and Statistics
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Seminar on Probability and Statistics
Wednesday March 10 2004
Tokyo 128
12:50-14:00 pm


Statistical properties of affine stochastic differential equations with memory, part I


Uwe KUECHLER
Institute of Mathematics Stochastics, Humboldt-University of Berlin

Abstract

Consider the affine stochastic delay differential equation (SDDE)
dX(t) = \int_{-r}^0 X(t+s)a(ds)dt + dW(t) (1)
where a(.) is an arbitrary finite signed measure on [-r,0] and W(.) is a standard Wiener process. Assume a(.) belongs to some family (a_{ heta}, heta\in\Theta) with \Theta\subset R^k. The maximum-likelihood-estimator \hat{ heta}_T based on continuous observation of (X(t), t \leq T) is constructed and its asymptotic behaviour is determined. The great variety of possible limit behaviour is surprising.




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Seminar on Probability and Statistics