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Seminar on Probability and Statistics |
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Seminar on Probability and Statistics Wednesday December 19 2007 Tokyo 122 4:20-5:30 pm
Sequential Tests for Criticality of Branching Processes.
永井 圭二 / NAGAI, Keiji 横浜国立大学 / Yokohama National Univ. Abstract We consider sequential testing procedures for detection of
criticality of Galton-Watson branching process with or without
immigration. We develop a t-test from fixed accuracy estimation
theory and a sequential probability ratio test (SPRT). We provide
local asymptotic normality (LAN) of the t-test and some asymptotic
optimality of the SPRT. We consider a general framework of
diffusion approximations from discrete-time processes and develop
sequential tests for one-dimensional diffusion processes to
investigate the operating characteristics of sequential tests
of the discrete-time processes. Especially the Bessel process with
constant drift plays a important role for the sequential test
of criticality of branching process with immigration.
(Joint work with K. Hitomi (Kyoto Institute of Technology) and Y. Nishiyama (Kyoto Univ.)) |
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