統計数学セミナー
Seminar on Probability and Statistics
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Seminar on Probability and Statistics
Wednesday December 19 2007
Tokyo 122
4:20-5:30 pm


Sequential Tests for Criticality of Branching Processes.


永井 圭二 / NAGAI, Keiji
横浜国立大学 / Yokohama National Univ.

Abstract

We consider sequential testing procedures for detection of criticality of Galton-Watson branching process with or without immigration. We develop a t-test from fixed accuracy estimation theory and a sequential probability ratio test (SPRT). We provide local asymptotic normality (LAN) of the t-test and some asymptotic optimality of the SPRT. We consider a general framework of diffusion approximations from discrete-time processes and develop sequential tests for one-dimensional diffusion processes to investigate the operating characteristics of sequential tests of the discrete-time processes. Especially the Bessel process with constant drift plays a important role for the sequential test of criticality of branching process with immigration.

(Joint work with K. Hitomi (Kyoto Institute of Technology) and Y. Nishiyama (Kyoto Univ.))




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Seminar on Probability and Statistics